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Monthly Archives: April 2016

GOEPEL electronic integrates boundary scan in SEICA flying probe testers

Seica Integration GÖPEL-P

The Flying Probe Testers (FPT) in the Pilot 4D line from SEICA are now available with a boundary scan option from GOEPEL electronic. The two test procedures together provide a cost-effective and time-efficient platform for testing electrical assemblies in production.

Posted in News

Compact SL In-line Automated Testing Solutions


In-circuit and Functional Tester – Compact SL offers a completely automated solution via an integrated, SMEMA-compatible conveyor system, allowing completely automatic board handling and easy integration into high volume production lines.

Posted in Video

Nepcon China 2016 – Booth 1L18


  In the ramp light : Industry 4.0 Strambino, Italy, April 2016 — The theme for Seica at Nepcon Shanhgai  this year will be the Pilot line and the traditional Compact line of bed of nails and functional testers integrated

Posted in Events

Compact Line – Manual Solutions


In-circuit and Functional Tester, The Compact Line is designed meeting the requirements of the so called “lean production”, with a specific attention to the requirements of the production environments of electronic boards.

Posted in Video