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Monthly Archives: January 2017

Flying probes take on the challenge of loss of test access


Today’s electronic circuit-board technology is posing a big challenge to in-circuit test techniques because of the disappearance of access. As a result, a shift from bed-of-nail to flying-probe equipment is ongoing. While the main drives for this shift are consumer

Posted in Press

Pilot V84D HF High Frequency test with Flying Probe


Pilot V84D HF The first prober flying up to 1.5 GHz, ntegration of the Seica worldwide proven Flying Probe technology for In-Circuit and functional test with National Instruments hardware and oftware capabilities for High Frequency signal validation.

Posted in Video

Mini ATE Line combined with a NI PXI rack


Mini ATE Line, a standard Seica ATE combined with a NI PXI rack meet together for optimized testing

Posted in Video