This site uses cookies. By continuing to browse the site, you are agreeing to our use of cookies. Find out more.
Monthly Archives: January 2017

Flying probes take on the challenge of loss of test access

Astrium-2

Today’s electronic circuit-board technology is posing a big challenge to in-circuit test techniques because of the disappearance of access. As a result, a shift from bed-of-nail to flying-probe equipment is ongoing. While the main drives for this shift are consumer

Posted in Press

Pilot V84D HF High Frequency test with Flying Probe

video-pilotv8-hf

Pilot V84D HF The first prober flying up to 1.5 GHz, ntegration of the Seica worldwide proven Flying Probe technology for In-Circuit and functional test with National Instruments hardware and oftware capabilities for High Frequency signal validation.

Posted in Video

Mini ATE Line combined with a NI PXI rack

video-mini

Mini ATE Line, a standard Seica ATE combined with a NI PXI rack meet together for optimized testing

Posted in Video