Seica Deutschland contributes on the Fraunhofer Institut Technology Day on 3rd of March

Seica Deutschland contributes on the Fraunhofer Institut Technology Day with the title

“Un-destroying Test Techniques” on 3rd of March in Itzehoe near Hamburg with an pre-

sentation with the title:

“Real Integration between ATE Flying Prober and Boundary Scan Tester”.

(This latest development of Seica S.p.A. was shortly presented at the Productronica

Show in Munich.)

Speaker is Bernd Hauptmann

General Manager Seica Germany

See the program

For more information please visit the following website:

www.isit.fraunhofer.de