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In-Circuit and Functional Testers

  • In-circit-tester
  • In-circuit-Tester
  • In-circuit-Tester
  • In-circuit-testers

The Compact Line is designed meeting the requirements of the so called “lean production”, with a specific attention to the requirements of the production environments of electronic boards.
It is ergonomically sophisticated and technologically competitive, offering the highest flexibility, high measurement accuracy, high test speed, in small spaces and minimum footprint with limited consumptions to grant a cutting edge and sustainable product.

Compact systems represent an optimal solution for:

  • Analog and digital in-circuit test
  • Analog, digital and power functional test
  • Boundary Scan type tests
  • Digital components programming (OBP of microcontrollers, memories, etc…)
  • High voltage test

Compact line is characterized by the research for optimization of the test costs, with a particular attention to the space reduction (footprint and overall dimensions), times (for test) and waste in general, granting however the full compatibility with the test programs and fixtures coming from Strategy Line.
All the systems of the Compact Line are based on the Seica VIP platform, comprehensive of the ACL synthesized drive and sense instruments and the VIVA management software; but if required the Compact Line systems may be controlled also by alternative software packages such as LabviewTM, LabWindowsTM/CVI and TestStandTM by National Instruments.

The Compact Line includes different models to meet the widest range of economic and technical requirements:
Compact TK
Compact SL
Compact Multi
Compact Power
Compact Multimedia
Compact Digital

In case of new requirements in performances and/or ergonomics, Seica can provide customized Compact solutions for a customer, integrating instruments and third party software packages, or with the design of dedicated hardware and software modules to meet the requirements of a specific customization.Icone-Brochure