Today a new challenge is connected to this situation: the requirement to test HF signals before final product assembly. Current electronics trend shows a major direction for the board production: miniaturization. More products have now very small dimensions and test engineers have no possibility to allocate the necessary test points for the validation.
The solution for this application is the Flying probe technology, integrating the high accuracy of positioning 8 probes on the UUT and the capability to measure very high frequency signals.
Based on the consolidated and complete solution of the Seica Flying Probes line, the Pilot4D V8HF includes the performance to test up to 1.6 GHz and locate probes on 008004 pad size. The Pilot4D V8HF vertical architecture is the optimum solution for probing both sides of the UUT simultaneously. This increases test accessibility and flexibility, while guarantees fast, precise, reliable and repeatable probing: full availability of all the mobile resources for testing the UUT. This solution represents an important technological innovation in double-sided flying probe test, overcoming the intrinsic limitations of horizontal systems. The requirement for standard ICT & Functional testing of the DUT is still part of the basic requirement and is realized using the Seica proprietary hardware, so that the implemented resources are used for the DUT validation. All power supply, DUT enable signals, current consumption control are realized with the 18 bit resolution ACL measuring card and switching matrix which allows future expansion capabilities.
Flylab and National Instruments Software Tools
To make the solution easier to use, as an unique tool in the market, the complete solution is driven by LabViewTM/TestStandTM interface. Engineers are now able to move probes on a specific target (down to 008004 components) and perform the highest definition test by using a graphical and user-friendly SW interface. The Flying Probe system still integrates Seica native capabilities but can be completely driven by LabViewTM functionalities and makes the technology available for all NI software users to implement new and additional features. All system resources are open and easy to manage. The DUT functionality can be tested under critical environmental conditions: the ability to implement a thermal stress test (from 0° to 70°C) is reached integrating a cooling and heating system in the testing area. Managed frequency can be implemented to reach the coverage of BT and WI-FI ranges to make the solution ever more performing.
The test tools and techniques of the PILOT4D V8HF include:
• FNODE signature analysis on the nets of the UUT
• Standard analog and digital in-circuit test
• Vectorless tests (JSCAN and OPENFIX), to test ICs for opens and shorts
• PWMON net analysis for power on the boards
• Continuity test to detect open tracks on the PCB
• Visual tests for component presence/absence and rotation
• Optional Thermal Scan Resources
• ALI: Automatic Laser Inspection for presence/absence and warpage
• Up to 4 HF channels with variable pitch ground probe
• Up to 1.5 GHz bandwidth with S-parameters compensation
• Up to 20 GSa/s depending of the instrument selected
• Active probe amplifier