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22 February 2012
Events

Nepcon China 2012 - April, 25-27

We will be present to the exhibition in the new building - Booth 1H70

SEICA China, the Chinese subsidiary, will be show again this year at the most  important exhibition of Chinese electronics industry, in a booth with the historical partner Smart Technology.  Seica China  will show the table system RTE-200 and the vertical system Pilot V8 with 8 mobile probes.

the RTE-200 system, an interesting functional test solution, equipped with analog, digital and boundary scan measurement capabilities, all integrated in a very small enclosure characterized by high portability and readiness for rack-style assembly in more complex systems.

 

The Pilot V8 represents the latest frontier in flying probe test technology and is the complete solution for those who want maximum performance: the highest test speed, test coverage and flexibility, whether they are testing prototypes, manufacturing lots, or repairing any type of board.  With 8 electrical flying probes , 2 Openfix flying probes , 2 power flying probes, 2 CCD cameras, and 2 thermal probes , the Pilot V8 has up to 16 mobile resources available to test the UUT, all included in a vertical, very compact and robust architecture, making the Pilot V8 unique in its genre. Its multiple flying probes can also execute parallel test on two UUTs at the same time, effectively doubling test capacity with respect to a 4-probe system. The mobile power probes represent another important innovation, which enables the power-up of the UUT  functional test  without requiring any additional, fixed cables

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