In the context of automated testing, the complexity of new technologies has brought challenges that both the flying probers and bed of nails testers are facing to the highest level. The increasing demand for functional testing, as well as on board programming, JTAG tests and testing through dedicated hardware, compel the user towards well thought-out choices within the test strategy. Add to this that the significantly most pressing concern is, beyond all doubt, related to achieving short test times at reduced costs.