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Monthly Archives: June 2015

Platform bridges gap between flying probers & bed of nails testers

Pilo-FX-03

In the context of automated testing, the complexity of new technologies has brought challenges that both the flying probers and bed of nails testers are facing to the highest level. The increasing demand for functional testing, as well as on

Posted in Press

Nepcon South China – Shenzhen

Nepcon-South-China-15

August, 25th – 27th Booth C-1A52 “Welcome to the new dimension of test, the fourth dimension”. The “new dimension” of test will be presented through several different lines of products, all designed around the common core of the enhanced VIP

Posted in Events

Bay Area Circuits Selects SEICA Flying Probe PCB Test System

US-Tech

SAN JOSE, CA – Bay Area Circuits, Inc. has purchased a Rapid 270 bare-board tester as announced by Seica Inc’s sales representative in Northwestern USA, Zero Defects International. This tester will augment a Seica S240 fully automated tester which has

Posted in News