S20-Line-Power-Semiconductor-Testing

The S20 Line is latest cutting-edge solutions for power semiconductor testing. With extensive expertise in probe card testing, leveraging high-performance platforms like the Pilot VX HR, Seica is now introducing two advanced systems designed specifically to meet the evolving demands of power semiconductor validation.

Introducing Seica’s Advanced Power Semiconductor Testing Solutions

S20 IS³ – HIGH-PRECISION TESTING FOR DISCRETE POWER DEVICES

The S20 IS³ system offers a cutting-edge solution for testing discrete power devices, including SiC and GaN technologies. Designed for both AC and DC static and dynamic testing, it performs accurate and repeatable characterization of electrical parameters, a crucial process to ensure the reliability and performance of components such as IGBTs, MOSFETs, and diodes, making it an essential tool for R&D, production, and quality control. 

Static tests measure key parameters such as on-state voltage (Vce, Vds), leakage current (Ic, Id), and threshold voltage (Vth), ensuring the device meets its electrical specifications. Dynamic tests evaluate switching characteristics, including turn-on/off times, rise/fall times, and energy losses, which are critical for real-world applications. By testing both static and dynamic parameters, manufacturers can detect potential failures before the components are integrated into power systems, thereby avoiding costly field failures while certifying that devices will perform optimally under operating conditions, 

The advanced measurement system of the S20 IS³ is able to perform high precision measurements, providing reliable and repeatable results, and has a compact, space-saving design with one-box integration of DC-Static, Gate, AC-Dynamic testing. The system is configurable, so the user can include the modules to perform the tests you need today, and expandable, allowing more modules to be added to meet new test requirements. The integrated high-level, menu-driven software is user-friendly, making for easy test setup, and a series of features, such as the integrated oscilloscope, facilitate the debug process, and provide full traceability of the test results.

Key Features of S20 IS³:

– AC & DC Testing: the system provides full static and dynamic evaluations to ensure complete component characterization.

– High Precision Measurements: delivers highly accurate, reliable, and repeatable test results to validate performance under operational conditions.

– Compact & Efficient Design: a space-saving, all-in-one architecture integrating DC-Static, Gate, and AC-Dynamic testing in a single platform.

– Flexibility & Expandability: the modular configuration allows users to select the necessary test modules for current needs while offering expansion capability for future test requirements.

– User-Friendly Interface: featuring intuitive, menu-driven software that simplifies test setup and operation. Additional features such as an integrated oscilloscope enhance debugging processes and ensure full traceability of test results.

These evaluations are essential for optimizing power semiconductor performance and ensuring reliability in real-world applications.

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S20 RTH – POWER CYCLING AND THERMAL THERMAL RESISTANCE CHARACTERIZATION

The S20 RTH test bench is designed to deliver precise thermal resistance (RTH) characterization with advanced power and cooling management capabilities. Among all semiconductor devices, transistors are by far the most important category and nearly all of them are three-pin devices (MOSFETs, BJTs, IGBTs) and, unlike diodes, they have a driving section which makes them more sensitive to issues related to the interaction between power handling and the input signal.

In modern power supply design, more and more attention is given to the electrical efficiency of the overall system and to the junction temperature of semiconductor devices, and this kind of test evaluates the thermal stress on power MOSFET devices when they are used in switch mode power supplies. By this computation and with the physical characteristics of the device, it is possible to predict the temperature reached inside the junction, and the allowable margin or heatsink required to assure that the system has a suitable thermal margin during operation. This approach is fundamental because correct computation allows for a more accurate evaluation of system lifetime and assures working operation within the Safe Operating Area.

The S20 RTH can safely handle high current loads (standard configuration is 1200A @15V or 30V), ensuring accurate thermal performance evaluation under real operating conditions.
Seica’s power switching hardware is a key element of the test architecture, enabling a programmable controlled shutdown of the load current which minimizes oscillations, allowing the system to perform precise measurements as soon as 80us after the high current shutdown. The configuration of the bench is scalable, starting from 2 Devices Under Test (DUTs) up to 12 DUTs tested in parallel, depending on throughput needs. The temperature, flow and pressure of the coolant to each DUT is automatically measured and controlled by the system, optimizing thermal stability and ensuring reliable measurements. This feature greatly simplifies initial setup operations, and can handle temperatures of up to 120°C and flow rates up to 100 l/min.

Key Features of S20 RTH:

• – High-Power Capability: capable of handling high current loads, with a standard configuration supporting 1200A @ 15V or 30V, ensuring accurate thermal analysis under real operating conditions.
• – Advanced Power Switching Control: utilizes Seica’s proprietary power switching hardware, enabling programmable controlled shutdown of the load current. This minimizes oscillations and allows precise thermal measurements as early as 80 microseconds after current shutdown.
• – Modular Architecture: the flexible system can scale from 2 Devices Under Test (DUTs) to 12 DUTs in parallel, adapting to various throughput and testing requirements.
• – Automatic Coolant Flow Control: integrates an advanced cooling management system that automatically regulates and monitors temperature, flow, and pressure of the coolant for each DUT. The system supports temperatures up to 120°C and flow rates up to 100 l/min, ensuring thermal stability and
  reducing setup complexity.

Thanks to the global extension of Seica and its subsidiaries, Seica can ensure local service support wherever the customer needs it, in addition to 24-hour telephone assistance.