Power Semiconductor Testers
Seica is pleased to introduce two innovative solutions dedicated to high-power semiconductor testing.
With the S20 Line, Seica delivers state-of-the-art performance and reliability for the most demanding applications.
With extensive expertise in probe card testing, leveraging high-performance platforms like the Pilot VX XL HR, Seica is now introducing two advanced systems designed specifically to meet the evolving demands of power semiconductor validation.
S20 IS³ – HIGH-PRECISION TESTING FOR DISCRETE POWER DEVICES
The S20 IS³ system offers a high-performance solution for testing discrete power devices, including advanced SiC and GaN technologies. Designed for R&D, characterization, quality control, and production environments, it combines high-precision measurement capabilities with a compact and modular architecture for comprehensive DC static, gate, and AC dynamic testing.
Supporting IGBTs, MOSFETs, SiC and GaN devices, diodes, and other discrete power semiconductors, S20 IS³ delivers accurate and repeatable characterization while addressing one of the most important challenges in semiconductor testing: reducing the cost of test without compromising performance or quality.
S20 RTH – POWER CYCLING AND THERMAL RESISTANCE CHARACTERIZATION
The S20 RTH is a high-performance test platform designed for accurate thermal resistance (RTH) characterization and power cycling of power semiconductor devices. Combining high-current capability, fast and controlled power switching, automated cooling management, and parallel testing, the system enables precise evaluation of device thermal behavior under demanding operating conditions.
Thermal performance is a critical factor in the design and reliability of modern power electronics. As power density increases, accurate characterization of the relationship between power dissipation and junction temperature becomes essential for evaluating thermal margins, cooling requirements, device lifetime, and operation within the Safe Operating Area (SOA).
S20 RTH provides the controlled electrical and thermal environment required to perform these measurements with high accuracy and repeatability, while its scalable architecture supports both engineering characterization and production-oriented test requirements.
Both the S20 IS³ and S20 RTH communicate and send all test measurements and binning data via industry wide standards. Due to Seica’s extensive software capabilities we can work together with the end user to meet any unique requirements.
