COMPACT line: the smart choice for ICT & Functional Testing

Why choose COMPACT line?
✔ Parallel testing – Test up to 4 boards at once for maximum efficiency
✔ Scalable solutions – From benchtop to fully automated systems
✔ Seamless integration – Works with National Instruments LabVIEW and existing MES systems
✔ User-friendly – Intuitive graphical interface and easy migration from older platforms
✔ Industry 4.0 ready – Smart, connected, and future-proof

What can it do?
✔ ICT – Open/Short, R/L/C, Diodes, Transistors, FETs, Regulators, and more
✔ On-board programming (OBP)
✔ Power ON & Functional Test (FUN) via CAN/LIN interface
✔ LED testing with sensors
✔ EOL and Run-in testing

The results?
✔ Faster test cycles
✔ Higher throughput
✔ Lower overall test costs

With COMPACT line, performance meets flexibility, making it the perfect choice for automotive, medical, industrial, and contract manufacturing applications.

Contact us for more informations: seicaisraelltd@seica.com