Seica has officially launched the OPERA Series, its new generation of test solutions designed to meet the increasing complexity of modern electronics manufacturing..
While the name may evoke the Italian musical tradition, OPERA actually stands for “Open Era,” reflecting Seica’s philosophy of openness, enabling flexibility, customization, and innovation. This approach, first introduced in 1992 with the VIP™ platform, combines a core hardware and software architecture with modular elements to create scalable, application-specific solutions. OPERA represents the latest evolution of this concept, extending Seica’s open platform to apply decades of technological expertise across all test systems.
Designed to support the full product lifecycle, from prototyping and new product introduction to mass production, repair, and maintenance, OPERA systems can be configured for a wide range of test requirements, including in-circuit, functional, boundary scan, LED, capacitive testing, and on-board programming. Their open architecture also enables full integration of external instrumentation and interoperability with third-party software.
The OPERA Series includes Seica’s complete portfolio of test solutions for electronic boards and modules, from simple to highly complex applications, including EV electronics, batteries, probe cards, and power components.
With over 30 years of experience in Flying Probe technology, Seica’s Rapid and Pilot systems deliver leading-edge performance and flexibility across all manufacturing environments. These solutions can be configured with a wide range of test methods to address everything from next-generation circuits with embedded components to highly complex, densely populated boards requiring multiple test techniques.
Seica’s Compact and Valid platforms for in-circuit and functional testing are fully integrated into the OPERA architecture, offering scalable and ergonomic solutions for both standalone and automated production environments. The Compact line, developed according to lean manufacturing principles, combines high configurability with a compact footprint and low power consumption, making it ideal for high-throughput production.
The Valid line is engineered for high-performance in-circuit and functional testing using bed-of-nails or fixed receiver configurations. The latest VALID LR and VALID SL systems feature a cableless architecture, new 128-channel scanner cards, and support a full range of test methods.
The VALID SL is a fully automated solution for high-volume production, with configurations exceeding 4,400 channels and an enhanced operator interface for improved usability and maintenance.
The VALID LR is designed for legacy system replacement, enabling seamless migration of existing test programs and fixtures while supporting both older technologies and advanced new test development. Its multi-resource architecture offers high flexibility and performance, supporting up to 5,888 channels.
OPERA is powered by the latest release of Seica’s VIVA™ software platform, which enhances performance and enables integration across all stages of the manufacturing process. It provides a guided workflow for test development and validation, integrated auto-debug, optimization algorithms to reduce test time, and advanced statistical tools for analyzing coverage, performance, and process stability.
The platform also offers customizable reports and operator interfaces, and integrates seamlessly with environments such as Python, Excel, C, C++, C#, and TestStand. By connecting data collection, traceability, MES interaction, and repair processes, VIVA transforms test systems into fully connected, data-driven assets.
