Power Semiconductor Testers
SEICA is pleased to introduce two innovative solutions dedicated to high-power semiconductor testing.
With the S20 Line, SEICA delivers state-of-the-art performance and reliability for the most demanding applications.
With extensive expertise in probe card testing, leveraging high-performance platforms like the Pilot VX XL HR, Seica is now introducing two advanced systems designed specifically to meet the evolving demands of power semiconductor validation.
S20 IS³ – HIGH-PRECISION TESTING FOR DISCRETE POWER DEVICES
The S20 IS³ system offers a leading-edge solution for testing discrete power devices, including SiC and GaN technologies. Designed for both AC-Dynamic and DC-Static testing, the Seica solution performs accurate and repeatable characterization of electrical parameters, a crucial process to ensure the reliability and performance of components such as IGBTs, MOSFETs, and diodes, making it an essential tool for production, quality control and R&D.
S20 RTH – POWER CYCLING AND THERMAL RESISTANCE CHARACTERIZATION
The S20 RTH test system is designed to deliver precise thermal resistance (RTH) characterization with advanced power and cooling management capabilities. Among all semiconductor devices, transistors are by far the most important category and nearly all of them are three-pin devices (MOSFETs, BJTs, IGBTs) and, unlike diodes, they have a driving section which makes them more sensitive to issues related to the interaction between power handling and the input signal. In modern power supply design, increased attention is given to the electrical efficiency of the overall system and to the junction temperature of semiconductor devices, and this kind of test evaluates the thermal stress on power MOSFET devices when they are used in switch mode power supplies. By this computation and with the physical characteristics of the device, it is possible to predict the temperature reached inside the junction, and the allowable margin or heatsink required to assure that the system has a suitable thermal margin during operation. This approach is fundamental because correct computation allows for a more accurate evaluation of component/device lifetime and assures working operation within the Safe Operating Area.
Both the S20 IS³ and S20 RTH communicate and send all test measurements and binning data via industry wide standards. Due to Seica’s extensive software capabilities we can work together with the end user to meet any unique requirements.
