SEICA CHINA is pleased to invite you to visit Booth #11A33 at NEPCON ASIA 2026, one of the leading trade shows in the electronics manufacturing industry, taking place from October 27 to 29, 2026, at the Shenzhen World Exhibition & Convention Center (Bao’an).
Visitors to Booth #11A33 will have the opportunity to learn more about Seica’s latest advancements in Flying Probe technology, from the flagship PILOT VX Flying Probe system to the new PILOT VX ULTRA for Probe Card Test, developed specifically for the semiconductor market. The new system will be officially launched at Electronica 2026, taking place November 10–13 at Messe München, Booth A4-459.
All these systems are part of Seica’s new OPERA Series, which represents Seica’s new generation of test solutions, developed to address the increasing complexity and evolving requirements of modern electronics manufacturing.
More than 30 years ago, Seica pioneered Flying Probe testing in Europe, laying the foundations for a technology that continues to evolve and shape the industry today. Since then, Seica has continued to drive innovation, establishing itself as a leading provider of Flying Probe solutions, with thousands of systems installed worldwide.
At the heart of this evolution is the PILOT VX, Seica’s flagship Flying Probe platform, combining speed, precision, and advanced testing capabilities. Designed to push the boundaries of performance, it delivers up to 50% faster testing, 12 multifunction heads, double-sided probing, and advanced measurement capabilities.
Building on this proven technology and Seica’s experience in probe card testing, the PILOT VX XL HR was developed to address the specific requirements of the semiconductor market, offering a comprehensive, turnkey solution for probe card testing.
Today, this technological evolution takes a further step forward with the introduction of the PILOT VX ULTRA for Probe Card Test, a new system within Seica’s portfolio, born from the PILOT Flying Probe family and designed specifically for semiconductor applications.
The PILOT VX ULTRA combines hardware and software in a single platform, supporting the entire probe card manufacturing process, from pre-assembly checks to final validation. It enables testing of individual MLOs and PCBs before assembly, as well as in-circuit (ICT) and functional testing of assembled PCBs. For final probe card testing, the system combines the PCB with the MLO and verifies every connection through ICT. It automatically generates dedicated test programs that account for resistance variations caused by differences in network lengths or MLO components. Advanced DSP-based measurement technology and high-speed capacitive testing ensure accurate and reliable results, while its flexibility supports complex probe card applications.
