Pilot VX ULTRA for SEMICONDUCTOR TEST
As semiconductor manufacturing becomes increasingly complex and miniaturized, wafer and probe card testing play a critical role in identifying defects, ensuring reliability and optimizing production costs. Building on its extensive experience in probe card testing, Seica introduces the new Pilot VX ULTRA, a flying probe system designed specifically for the Semiconductor market and the testing of probe cards.
Part of Seica’s new OPERA Series, Pilot VX ULTRA combines high-precision electrical testing with advanced optical inspection. Its new nanometric infrared camera enables accurate detection of extremely small physical defects, while enhanced Soft Touch and Soft Landing technologies protect delicate surfaces from scratches.
The Pilot VX ULTRA, like all Seica solutions, integrates the VIVA software platform. This includes automatic generation of BBT and ICT test programs by importing CAD/CAM data in IPC-D356A (CAM350) and ODB++ formats, and provides comprehensive data output for thorough traceability of the tests performed.
The Pilot VX ULTRA can also be managed remotely via a web-based control panel, allowing operations that would typically require the operator to be present at the machine. This enables centralized control and faster setup and monitoring of the production line. The system is integrable with the company’s MES, thereby complying with Industry 4.0 standards.
Key Technological Features
• High-Resolution Infrared Nanometric Camera
• Advanced Soft-Touch and Soft-Landing Technologies
• Double-Sided Flying Probe Architecture
• Large Test Area and Heavy-Board Handling
• Controlled Manufacturing Environment Compatibility
• Advanced Software
• Automation and Industry Integration
For more information: sales@seica.com
DIFFERENT ARCHITECTURES FOR DIVERSE SOLUTIONS
The PILOT line offers architectural solutions, each one optimized for a specific type of application scenario:
