Seica presents its latest innovations in testing and measurement at EFX 2026.
From October 6 to 8 in Stuttgart – Germany, Seica will be exhibiting at Booth 9D56 in Hall 9, presenting its latest solutions for the testing and measurement of printed circuit boards, modules and semiconductors.
Collaboration with its customers and the know-how Seica has acquired through decades of experience in developing test solutions have transformed the company into a reference point for intelligent innovation. This enables us to offer state-of-the-art, high-performance and integrated test solutions.
Flexibility instead of high volumes
Traditional high-volume production is becoming less important in many European markets. Instead, flexible manufacturing, smaller batch sizes and a high variety of products are becoming increasingly central.
Added to this are increasingly shorter product life cycles and growing time pressure: the period from development to series production is continuously becoming shorter. Especially for prototypes, NPI projects and frequent design changes, the test system must therefore be able to adapt quickly and flexibly to new requirements.
At the same time, quality requirements remain extremely high. Particularly for complex high-tech products, reliable and reproducible test results are essential.
Flying Probe – maximum flexibility for modern electronics manufacturing
It is precisely in this context that Flying Probe test systems offer decisive advantages. Without the need for costly test fixtures, they enable electronic assemblies to be tested flexibly, even with small batch sizes, frequent variant changes and constantly evolving designs. Flying Probe is therefore evolving from a niche solution into an important component of modern electronics manufacturing.
The decisive question is therefore no longer simply: How can I test my electronic assembly?
But rather:
How can I test complex electronic systems quickly, flexibly, reliably and cost-effectively, even when the product, design and quantities are constantly changing?
Flying Probe test systems provide a convincing answer to this need.
At our booth, you will be able to see the Pilot VX OPERA in action, even faster and more flexible, a new-generation Flying Probe system.
Benefit from solid technical expertise, best practices from real production environments and valuable networking opportunities with electronics manufacturing professionals and decision-makers.
PILOT VX is part of Seica’s new OPERA Series, officially launched in early June. The OPERA Series represents Seica’s new generation of test solutions, developed to address the increasing complexity and evolving requirements of modern electronics manufacturing.
Seica’s flagship PILOT VX flying probe system delivers speed, precision, and smarter test execution. Built for today’s accelerated product lifecycle—from concept to production—the PILOT VX delivers significant reductions in test time thanks to its advanced mechanical architecture and proprietary motion controllers, cutting cycle times by up to 50%.
With 12 multifunction test heads and double-sided probing of up to 60 points simultaneously, the system offers unmatched coverage. High-power probing (up to 2 A per probe), microwave-based measurement capabilities, and optional high-frequency tools—including a 750+ MHz flying oscilloscope—provide exceptional diagnostic depth. The latest generation of integrated LED sensors, combining visible and infrared technologies, further expands inspection capability.
